HTS 9031.90.54.00

Description

9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof > Parts and accessories > Of other optical instruments and appliances, other than test benches > Of optical instruments and appliances of subheading 9031.41 or 9031.49.70

Estimated US duty by country of origin

Base rate plus the additional tariffs that apply today (China Section 301, the 2026 country tariff). Steel, aluminium and some other goods can owe more.

Other codes under heading 9031

• 9031.10.00.00 · FreeMachines for balancing mechanical parts
• 9031.20.00.00 · 1.7%Test benches
• 9031.41.00.20 · FreeOther optical instruments and appliances > For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) > For inspecting photomasks or reticles used in manufacturing semiconductor devices
• 9031.41.00.40 · FreeOther optical instruments and appliances > For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) > For inspecting semiconductor wafers or devices > For wafers
• 9031.41.00.60 · FreeOther optical instruments and appliances > For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) > For inspecting semiconductor wafers or devices > Other
• 9031.49.10.00 · FreeOther optical instruments and appliances > Other > Profile projectors
• 9031.49.40.00 · FreeOther optical instruments and appliances > Other > Coordinate-measuring machines
• 9031.49.70.00 · FreeOther optical instruments and appliances > Other > For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices
• 9031.49.90.00 · FreeOther optical instruments and appliances > Other > Other
• 9031.80.40.00 · FreeOther instruments, appliances and machines > Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles
• 9031.80.80.60 · FreeOther instruments, appliances and machines > Other > Equipment for testing the characteristics of internal combustion engines > For testing electrical characteristics
• 9031.80.80.70 · FreeOther instruments, appliances and machines > Other > Equipment for testing the characteristics of internal combustion engines > Other
• 9031.80.80.85 · FreeOther instruments, appliances and machines > Other > Other
• 9031.90.21.00 · FreeParts and accessories > Of profile projectors
• 9031.90.45.00 · FreeParts and accessories > Of other optical instruments and appliances, other than test benches > Bases and frames for the coordinate-measuring machines of subheading 9031.49.40
• 9031.90.59.00 · FreeParts and accessories > Of other optical instruments and appliances, other than test benches > Other
• 9031.90.70.00 · FreeParts and accessories > Other > Of articles of subheading 9031.80.40
• 9031.90.91.30 · FreeParts and accessories > Other > Other > Of machines for balancing mechanical parts
• 9031.90.91.60 · FreeParts and accessories > Other > Other > Of test benches
• 9031.90.91.95 · FreeParts and accessories > Other > Other > Other